Accelerated X-Ray Analysis for Nanoscale Imaging (XANI) of Novel Materials
A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors,...
A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors, batteries, and catalysis. It produces ultrashort X-ray pulses that can record the movements of atoms and electrons. These instruments can detect the smallest change in material structure caused by defects and other influences.
This post is the second of a three-part series. See also Model Quantization: Concepts, Methods, and Why It Matters and Model Quantization: Turn FP8 Checkpoints...
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